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Product category: ATE Systems
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial Team on 06 September 2004
Parametric test systems bound for Korea
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Keithley Instruments has received a multiple-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF parametric test systems.
Keithley Instruments has received a multiple-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF parametric test systems The multi-million-dollar order represents tools for production process control of both 200 and 300mm wafers