Pick a waveform... any waveform: News from Tektronix

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Tektronix has introduced a new multichannel arbitrary waveform generator (AWG) series. As digital communication products advance at an unprecedented rate, design engineers are increasingly challenged to accurately and flexibly simulate complex, digitally modulated signals required by applications such as physical layer test or semiconductor characterisation and functional test. The new Tektronix AWG410, AWG420 and AWG430 models are designed to meet those needs, enabling engineers to generate signals with the best fidelity in the AWG market.

"As our customers create faster and more complex digital products, they look to Tektronix' test and measurement leadership to meet their ever-changing design and development requirements", said Craig Overhage, vice president, Instruments Business Unit, Tektronix.

"With broad applications in the computer, communications and semiconductor industries, these new high-resolution AWGs provide engineers with the ability to generate various waveform shapes for current and future technologies such as a next-generation communication modulation protocol", he added.

The AWG410 is an affordable single-channel AWG for design engineers who need a universal mixed-signal source.

The AWG420 is an in-phase and quadrature (I and Q) modulation source that contains two independent waveform channels, aimed at the needs of baseband design engineers.

The AWG430 features a third synchronised channel, enabling baseband and semiconductor designers to control additional analogue circuitry.

The third channel can be used for automatic gain control circuits, liquid crystal display products or charge-coupled devices that require red, green and blue simulation.

Each model features industry-leading 16bit resolution that enables designers to create real-world signals with greater fidelity than previously available on a generator in the mid-range price and performance category.

A 200Msample/s sample clock rate allows engineers to generate signals requiring higher baseband datarates.

Up to 16M record length with real-time sequencing creates longer data string packets with an infinite combination of waveform faults and variations for optimum parametric testing.

In addition, an optional 16/32/48bit 100MHz (TTL) digital data generator provides the ability to use synchronised analogue and digital mixed signals for device testing, addressing the needs of RF/wireless baseband designers.

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