News Release from: Teradyne
Edited by the Electronicstalk Editorial Team on 13 June 2003
In-circuit testers protect low-voltage devices
Teradyne has added SafeTest protection technologies to its line of TestStation in-circuit test systems.
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Teradyne has added SafeTest protection technologies to its line of TestStation in-circuit test (ICT) systems. SafeTest protection technologies protect today's newest low voltage devices against exposure to the overvoltage and overcurrent conditions common to conventional in-circuit test systems, providing electronics manufacturers with the safest, most accurate and risk-free solution for in-circuit testing. "The smaller device sizes and lower maximum voltage thresholds of today's newest low voltage technology components expose electronics manufacturers to considerable risk of damaging components through over-voltage and over-current during powered-up in-circuit testing with conventional ICT solutions", said Alan Albee, Marketing Product Manager at Teradyne.
"SafeTest protection technologies enable Teradyne's TestStation ICT solutions to safely and accurately test new low voltage devices.
This eliminates the risk of damaging or severely weakening these new devices, ensures product quality and reduces overall product costs".
SafeTest protection technologies combine Teradyne's patented UltraPin digital pin electronics and powerful TestStation software features for accurate, reliable and safe powered-up testing of today's new low-voltage technologies.
SafeTest protection technologies feature: automatic driver verification - ensuring each pin achieves its programmed threshold; backdrive current sensing - identifies unreliable and potentially harmful tests; a closed-loop driver - delivers accurate programmed voltages even under backdriving and fault conditions; multilevel digital-isolation software - prevents dangerous voltage spikes; per-pin programmable logic thresholds and timing - eliminates overvoltage conditions and test compromises due to tester limitations; programmable backdrive current and duration thresholds - allow programmer control of backdrive current and duration; and a specialised digital controller quickly executes test vectors to minimise backdrive duration.
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