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Product category: ATE Systems
News Release from: Teradyne | Subject: Nepcon Shanghai
Edited by the Electronicstalk Editorial Team on 08 April 2002
Inspection solutions on show in Shanghai
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Teradyne's Assembly Test Division is to exhibit its major electronics manufacturing test and inspection solutions at the Nepcon Shanghai tradeshow from 9th to 12th April 2002.
Teradyne's Assembly Test Division is to exhibit its major electronics manufacturing test and inspection solutions at the Nepcon Shanghai tradeshow from 9th to 12th April 2002 "Nepcon Shanghai is an ideal opportunity for us to demonstrate the breadth and depth of Teradyne's unique product range", said Patrick Tong, General Manager of Teradyne Asia