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Product category: Design and Development Software
News Release from: Synopsys | Subject: DFT Compiler and TetraMAX ATPG
Edited by the Electronicstalk Editorial Team on 15 April 2004

Deep submicron designs stand the test of
time

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The new releases of DFT Compiler and TetraMAX ATPG have improved design-for-test and automatic test pattern generation performance and pattern count for deep submicron designs.

The new releases of DFT Compiler and TetraMAX ATPG - key products in Synopsys' Galaxy Test Solution - have improved design-for-test (DFT) and automatic test pattern generation (ATPG) performance and pattern count for deep submicron (DSM) designs Customer benchmarks show two- to five-times improvement in DFT synthesis runtimes, and two- to three-times improvement in pattern count over the previous releases