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Product category: Design and Development Software
News Release from: Synopsys | Subject: TetraMAX TenX
Edited by the Electronicstalk Editorial Team on 19 September 2002
Addon speeds automatic test pattern
generation
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TetraMAX TenX provides distributed processing for automatic test pattern generation.
TetraMAX TenX provides distributed processing for automatic test pattern generation (ATPG) Distributing compute-intensive ATPG tasks across multiple central processing units, workstations and servers helps accelerate ATPG for the largest and most complex designs, thereby reducing manufacturing test development time and lowering the overall cost of test
This article was originally published on Electronicstalk on 19 Apr 2001 at 8.00am (UK)