Visit the National Instruments web site
Click on the advert above to visit the company web site

Product category: Design and Development Software
News Release from: Synopsys | Subject: TetraMAX TenX
Edited by the Electronicstalk Editorial Team on 19 September 2002

Addon speeds automatic test pattern
generation

Request your FREE weekly copy of the Electronicstalk email newsletter. News about Design and Development Software and more every issue. Click here for details.

TetraMAX TenX provides distributed processing for automatic test pattern generation.

TetraMAX TenX provides distributed processing for automatic test pattern generation (ATPG) Distributing compute-intensive ATPG tasks across multiple central processing units, workstations and servers helps accelerate ATPG for the largest and most complex designs, thereby reducing manufacturing test development time and lowering the overall cost of test