Product category: ATE Systems
News Release from: Seica | Subject: Aerial
Edited by the Electronicstalk Editorial Team on 13 November 2006
System speeds PCB test throughput
Flying probe test system addresses demand for cost-effective test solutions that will further enhance ease of programming, high fault coverage and fast throughput for PCB test
Seica will present a new addition to its line of flying probe test systems at Electronica (Stand A1.459) to address the growing demand to provide cost-effective test solutions that will further enhance ease of programming, high fault coverage and fast throughput for PCB test. Aerial is based on the core hardware and software of the Viva Integrated Platform (VIP) and uses four completely independent, mobile test probes to carry out tests on both sides of the board under test (two on each side).
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It is particularly indicated for testing prototypes, samples, small and medium series, providing maximum flexibility of use to reduce the time and costs of board development.
The vertical, very compact structure of Aerial M4 makes it easy to load and test even very large boards and its innovative clamping system ensures that there is virtually no vibration or oscillation of the board during test for maximum probing efficiency.
As the standard electrical test, Aerial uses the Seica proprietary OTPN (one touch per net) technique: multitone signals are injected through the nets of the UUT and the results are analysed with fast Fourier transforms (FFT) to characterise the net and identify faults on subsequent boards to be tested.
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Other tests, for example verification of junction faults, are also executed during the same OTPN.
In this way test program generation is simple and immediate, fault coverage is high and throughput is maximised.
'The Aerial represents a simple, immediate solution to those customers who need to implement a test strategy that is cost-effective and is very easy to program and operate, even for nonspecialised personnel', says Antonio Grassino, President of Seica.
Options include the in-circuit test and visual inspection software modules and the system is provided with data collection and statistics functions, and, since it is based on VIP technology, it is fully compatible with the other members of the Seica family: Pilot flying probe, Strategy in-circuit and Valid functional testers.
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