News Release from: Seica
Edited by the Electronicstalk Editorial Team on 28 February 2005
Test platform covers full product lifecycle
A new integrated test platform from Seica includes cutting-edge technology to implement the multiple test strategies needed to address the challenges of electronic testing.
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A new integrated test platform from Seica, Italy's leading electronics test solutions OEM, is based on a unique software and hardware architecture which includes cutting-edge technology to implement the multiple test strategies needed to address the challenges of electronic testing - from the new product introduction (NPI) stage, during the manufacturing process, right through to the logistics centres that provide test and repair services. Announcing the launch of the Viva Integrated Platform (VIP), Dave Sigillo, Seica's General Manager for North America operations stated: 'There is no doubt with the escalating density and complexity of modern electronics, increasing pressures to reduce cost and cycle time, and shorter product life cycles are stressing test solutions at all levels'. 'The new Seica platform uses advanced technology such as digital signal processing and synthetic instruments combined with the innovative Viva software to optimise test program development time, fault coverage and test time'.
'VIP has been designed to have a positive effect on all three interlinked variables which contribute to the overall cost of test without any compromises'.
The integrated DSP-based instrumentation represents a leap ahead in analogue test, taking advantage of the high definition and resolution of the digital world to execute precision testing of even the lowest-value components.
VIP brings the power and flexibility of 'synthetic' instruments into the test environment, placing a wide range of specific instrument functions at the user's disposal, without the significant investment required in more traditional instrumentation.
The innovative Viva software included in VIP, organises test program development into a simple three-step, prepare-verify-test process, which guides the user through a series of automated operations in an intuitive, self-explanatory environment.
Using a common software architecture on all Seica products brings several key benefits, such as seamless migration between different test strategies used throughout the product's life cycle (from prototype, through production, to repair) and incremental test generation, which allows additional performance to be added to the existing program without regenerating an entirely new test program.
Existing programs can be deployed on a new platform or new features can simply be added to enhance fault coverage on a given system.
For example, a flying prober can be expanded to perform power-on functional test or be connected to a bed-of-nails interface, or an in-circuit tester can add high performance functional capabilities, while a functional platform can embrace in-circuit test addons.
'We are implementing Seica's new VIP into all of our products, to give our customers the real benefit of the power and flexibility they need to maximise their test investment through the entire life cycle of a product, while reducing overall cost of test', adds Sigillo: 'which is precisely what we believe new technology should do'.
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Copyright © 2000-2006 Pro-Talk Ltd, UK. Based on news supplied by Seica - Subject: Viva Integrated Platform
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