Software library expands in-circuit testing

A new version of the EGTSL enhanced generic test software library for in-circuit tests expands the CompactTSVP open test platform into an even more powerful multipurpose tester.

With the new version 2.3 of the EGTSL enhanced generic test software library for in-circuit tests, Rohde and Schwarz is expanding its R and S CompactTSVP open test platform into an even more powerful multipurpose tester.

The software provides a previously unavailable level of openness that lets users expand the test solution at any time by adding further test methods for new components.

An automatic test generator and the intuitive graphical user interface enable you to implement error-free in-circuit test applications quickly without requiring much previous experience.

The CompactPCI/PXI-based test platform thus makes it possible to perform configuration and function tests of electronic modules on one system.

The flexibility of the R and S CompactTSVP system platform in function tests, which is obtained by using Rohde and Schwarz measurement and switching modules as well as modules in accordance with the CompactPCI/PXI standard, is now also available for the in-circuit test.

The R and S TS-PSAM module makes it possible to discharge electronic modules.

Furthermore, users can perform contact, short-circuit and continuity tests as well as two- and four-pole resistor measurements.

By adding the R and S TS-PICT in-circuit test extension module and the R and S TS-PSU power supply module test engineers can integrate the entire in-circuit test function into the test platform.

The number of available test points can be selected in steps of 90.

The ICT program is generated by the automatic test generator (ATG), which calculates test suggestions for the relevant modules in XML format directly from the CAD data.

The ATG automatically selects the relevant test and guard points and generates a wiring list.

The intuitive, graphical debug user interface of R and S EGTSL allows users to optimise the ICT program highly efficiently.

Knowledge of a special programming language or syntax is not necessary.

The generated ICT program can be easily integrated into functional test programs by means of only a few function calls of the EGTSL runtime library.

As users can seamlessly integrate their own simple function tests or test methods for new components, the new R and S EGTSL version makes even more powerful and versatile in-circuit tests possible.

The modules for the analogue in-circuit test and associated R and S EGTSL software in version 2.3 are now available from Rohde and Schwarz.

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