Transient module guarantees high defect coverage
A Q-Star Test product story
Edited by the Electronicstalk editorial team May 2, 2006
A new measurement module enables a quick and easy application of transient current tests in a production test environment.
Q-Star Test, the premier supplier of advanced high speed and highly accurate IDD test and measurement solutions presents its new QT-1411 IDDT transient current monitor module.
IC manufacturing technologies scaling down to ever-smaller geometries in combination with an increasing number of interconnection layers result in a shift of the dominant defect type from short to open