ATE module aims to spot nanometre-scale defects
A Q-Star Test product story
Edited by the Electronicstalk editorial team Feb 17, 2004
The QT-1410 is a novel digital transient current monitor module that aims to increase IC test coverage while reducing test cost and time to volume.
The scaling down of IC manufacturing technologies to ever-smaller geometries results in a shift of the dominant defect type from short circuits to open circuits.