Product category: Design and Development Software
News Release from: Mentor Graphics UK | Subject: YieldAssist
Edited by the Electronicstalk Editorial Team on 02 November 2005
Diagnostic tool enhances semiconductor
yield
Mentor Graphics' YieldAssist diagnostic tool enhances semiconductor yield and expands the firm's Design-for-Test product portfolio and platform beyond classical test generation and defect detection.
With the ability to quickly and accurately identify and isolate yield-limiting defects, Mentor Graphics' YieldAssist diagnostic tool enhances semiconductor yield and expands the company's Design-for-Test (DFT) product portfolio and platform beyond classical test generation and defect detection The product takes failure information directly from manufacturing test, and through advanced diagnostics, identifies failure causes to facilitate yield learning and eliminate weeks of manual analysis effort
This article was originally published on Electronicstalk on 24 Oct 2006 at 8.00am (UK)
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