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Product category: Design and Development Software
News Release from: Mentor Graphics UK | Subject: YieldAssist
Edited by the Electronicstalk Editorial Team on 24 October 2006
Improved analysis of manufacturing
failures
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The Mentor Graphics YieldAssist tool now supports an automated, server-based use model for high volume diagnosis of wafer test failures.
The Mentor Graphics YieldAssist tool now supports an automated, server-based use model for high volume diagnosis of wafer test failures With the ability to quickly and accurately identify and isolate yield-limiting defects, the YieldAssist product represents a new era in the analysis of manufacturing failures, and enables a new source of yield learning