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Product category: ATE Systems
News Release from: LogicVision Europe | Subject: Advantest's T6000 series
Edited by the Electronicstalk Editorial Team on 08 April 2002
Embedded test technology boosts SoC
throughput
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LogicVision has successfully integrated its embedded test technology into Advantest's T6000 series testers to provide faster test and diagnosis of complex SoC devices.
LogicVision has successfully integrated its embedded test technology into Advantest's T6000 series testers to provide faster test and diagnosis of complex SoC devices With the growth of SoC devices containing integrated multiple functions and intellectual property cores, both companies are addressing the challenge of overall increasing costs to test these devices