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Product category: ATE Systems
News Release from: LogicVision Europe
Edited by the Electronicstalk Editorial Team on 19 December 2001
LogicVision to boost reliability of
MoSys 1T-SRAM
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LogicVision and MoSys are collaborating to qualify and deliver embedded test and built-in repair analysis for the MoSys 1T-SRAM family of high-density embedded memories.
LogicVision and MoSys are collaborating to qualify and deliver embedded test and built-in repair analysis for the MoSys 1T-SRAM family of high-density embedded memories MoSys and LogicVision have already verified the integration and implementation of LogicVision's Memory BIST, and top-level test assembly technologies on MoSys 1T-SRAM embedded memories