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Product category: Test Accessories
News Release from: LEM Instruments | Subject: Micro Clamp AC current probes
Edited by the Electronicstalk Editorial Team on 15 April 2003

Current probes aim for tight spaces

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The new Micro Clamp series of AC current probes for current measurements up to 300A RMS combine a lot of features within a compact design

The new Micro Clamp series of AC current probes from LEM for current measurements up to 300A RMS combine a lot of features with the smallest design (116 x 43 x 23mm) with a capacity jaw for cables with 15mm maximum conductor size. The measured values are available at the output as current or voltage (AC or DC) signal on sockets or cable connection with an accuracy of +/-1% of the reading.

The state-of-the-art design with the latest transformer technology offers a wide dynamic range and a large bandwidth from 30Hz to 40kHz.

The new probes' design incorporates a unique safety feature for short-circuit protection called SIAC.

Due to the absence of the jaw tip protection (which is necessary in other designs), these probes have several distinct advantages.

These include easy access in space-restricted areas, no friction when closing the jaws, easy cleaning, and unlike classic protection, the SIAC mechanism ensures no probe wear, due to abrasion or shocks from conductors.

The new Micro Clamp probes comply with relevant safety standards and satisfy the needs of professional electricians in the field of service and maintenance and are an essential tool for power quality tasks.

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