Test, Measure and Automate Your World

Product category: Stand-Alone Instruments
News Release from: LEM Instruments | Subject: Analyst 3P
Edited by the Electronicstalk Editorial Team on 25 November 2004

Analyser covers energy and disturbance

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LEM's new Analyst 3P energy and disturbance analyser offers the widest range of measurements with the clearest display and analysis capabilities in its class

The use of a central rotary selector for measurement tasks makes instrument operation very simple. Display of measurement information in a clear, understandable format is achieved with a bright colour display. The new analyser offers ten days of recording with ten minute averages. Measurement functions include voltage, current, power and harmonics with associated values.

Additionally, the Analyst 3P can monitor voltage events down to 10ms; helping to track down the voltage dips and surges that are believed to be the largest single contributor to equipment failure and process disruption.

This feature, combined with the instrument's capability of measuring up to the 40th harmonic for voltage and current, make it an all-round unit for energy and power quality testing.

The Analyst 3P is supplied in a protective, tough rubber holster, together with voltage measuring leads, a three phase LEM-Flex flexible current probe set, voltage measuring leads, PC connecting lead, PQLogView software and a rugged carrying case.

The PQLogView software is a one-step download, analysis, exporting and reporting software package.

The process makes measurement and reporting a straightforward, intuitive operation.

The tabbed operation of the software enables all available views of the captured data to be displayed and reported with a click of the mouse.

Additional current probes are available for low current measurements.

Safety features conforming to IEC1010 provide confidence when working in hazardous voltage areas, and conformance with EMC standards ensures high reliability through reduced susceptibility to electromagnetic influences.

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