Deal targets characterisation of novel materials
A Keithley Instruments product story
Edited by the Electronicstalk editorial team Jul 18, 2007
Keithley and CEA Leti will research methods for characterising advanced semiconductor materials and devices that support DC, high frequency and RF-level signals.
Keithley Instruments has entered into a joint development partnership on semiconductor device material testing technology with CEA Leti, one of the world's most sophisticated semiconductor development laboratories.
The deal calls for Keithley and CEA Leti to research methods for characterising advanced semiconductor materials and devices that support DC, high frequency and RF-level signals on both micro- and nano-level structures.
CEA Leti will use Keithley RF-enabled semiconductor test eq