Tester gets the measure of advanced IC reliability
A Keithley Instruments product story
Edited by the Electronicstalk editorial team Apr 14, 2005
The S510 semiconductor reliability test system is a high-channel-count turnkey solution for use in reliability testing and lifetime modelling of the world's most advanced ULSI CMOS processes.
The S510 semiconductor reliability test system is a high-channel-count turnkey solution for use in reliability testing and lifetime modelling of the world's most advanced ULSI CMOS processes at the 65nm node and beyond.
It provides a high degree of wafer-level reliability (WLR) test throughput and flexibility, reducing the time to assess reliability and to perform lifetime modelling, thereby ultimately decreasing time-to-market for projects in technology development and process qual