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Product category: ATE Systems
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial Team on 16 September 2003

Toshiba chooses parametric test system

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Toshiba Corp has selected the Keithley S630DC/RF parametric test system to support production of its newest generation of semiconductors.

Toshiba Corp has selected the Keithley S630DC/RF parametric test system to support production of its newest generation of semiconductors The selection by Toshiba's Advanced Logic Technology Department in Yokohama, Japan, identifies the Keithley system as the preferred parametric test platform