Product category: ATE Systems
News Release from: Keithley Instruments | Subject: Model S600DC/RF APT system
Edited by the Electronicstalk Editorial Team on 01 February 2002
Speedy parametric tester doesn't need
babysitting
Keithley Instruments has released what it claims to be the industry's fastest automated parametric test (APT) system for integrated DC and RF wafer measurements.
Keithley Instruments has released what it claims to be the industry's fastest automated parametric test (APT) system for integrated DC and RF wafer measurements The Model S600DC/RF APT system is a single-insertion DC/RF parametric test solution for probing communications and high speed digital devices at the wafer level
This article was originally published on Electronicstalk on 19 Jun 2008 at 8.00am (UK)
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