Product category: ATE Systems
News Release from: Goepel Electronic | Subject: Boundary scan option for Spea 3030
Edited by the Electronicstalk Editorial Team on 21 September 2006
In-circuit tester adds boundary scan
option
Goepel Electronic and Spea have developed a next generation boundary scan option for the Spea 3030 in-circuit tester (ICT).
Goepel Electronic and Spea have developed a next generation boundary scan option for the Spea 3030 in-circuit tester (ICT) The solution is based on the complete integration of Goepel Electronic's recently introduced Scanflex hardware architecture, in combination with the Cascon Galaxy boundary scan system software, involving the analogue and digital pin electronics of the Spea 3030
This article was originally published on Electronicstalk on 26 Jul 2004 at 8.00am (UK)
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"After the successful implementation of our boundary scan tools on the Spea 4040 flying probe tester, we can now also offer the same level of sophi