White paper on surface characterisation techniques

A new white paper from Ceram shows how modern surface characterisation techniques can be used to obtain quantitative chemical and physical information on the composition of semiconductor materials.

The white paper, entitled 'Surface Characterisation in the Semiconductor Industry' illustrates how data gained from these techniques is proving crucial for process engineers, designers and failure analysts to optimise production yields, reduce failure rates and improve semiconductor device design.

To read more and download the free white paper, visit www.ceram.com/semicon.

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