Product category: Design and Development Software
News Release from: Cadence Design Systems | Subject: Cadence Encounter Test solution
Edited by the Electronicstalk Editorial Team on 24 October 2007
Software spots chip flaws
The Cadence Encounter Test solution was able to help IBM meet its goals for quality and volume production.
Cadence Design Systems has helped IBM deliver high-quality, high-volume chips for consumer devices by enabling the detection and correction of "small delay defects", miniscule defects that are nearly invisible without sophisticated test programs that operate above the normal operating speed of the chip Most recently, the Cadence Encounter Test solution was able to help IBM meet its goals for quality and volume production of a high-performance custom chip based on IBM's Power Architecture technology
This article was originally published on Electronicstalk on 20 Nov 2001 at 8.00am (UK)