Product category: Design and Development Software
News Release from: Cadence Design Systems | Subject: Encounter Test
Edited by the Electronicstalk Editorial Team on 27 October 2006
Advanced LSI ICs are designed for
testing
NEC uses Encounter Test products to improve the testability and quality of complex devices used in high-end computers developed by the NEC Computers Division.
NEC Corporation is adopting the Cadence Encounter Test products to improve the testability and quality of complex devices used in high-end computers developed by the NEC Computers Division This was made possible by the deployment of Encounter True-Time Test, which identifies small delay defects, commonly present in devices manufactured using advanced process technology and often not detectable with existing test methodologies
This article was originally published on Electronicstalk on 2 Oct 2003 at 8.00am (UK)
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