Product category: Design and Development Software
News Release from: Cadence Design Systems | Subject: Encounter Test Solutions
Edited by the Electronicstalk Editorial Team on 1 October 2003
Test solutions span
design to manufacture
Encounter Test Solutions is claimed as the most comprehensive test solution available on the market to support a unified test methodology bridging design and manufacturing
Encounter Test Solutions helps design and test engineers reduce test cost and offers superior test coverage to aid in product quality improvement. In addition, it specifically addresses the unique needs of product and process engineers who experience large inefficiencies in time and effort when endeavouring to improve yield.
This article was originally published on Electronicstalk on 1 October 2003 at 8.00am (UK)
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Encounter Test Solutions breaks new ground by accelerating defect identification and linking design and manufacturing data.
This enables dramatic improvements in time-to-volume and time-to-yield for semiconductor and system companies.
Encounter Test Solutions consists of two products: Encounter Test Design Edition and Encounter Test Manufacturing Edition.
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Encounter Test Design Edition, targeted for design and test engineers, includes automated design-for-test (DFT) insertion, capacity for designs with more than 50 million gates, memory built-in-self-test (BIST), embedded core test, test compression with x-state masking and compact, high-coverage delay tests.
Encounter Test Manufacturing Edition, is a state-of-the-art failure diagnostic environment that analyses design intent and manufacturing information.
Encounter Test Manufacturing Edition enables product and process engineers to achieve up to 2.5 times higher diagnostics callout efficacy over conventional approaches.
"We have used Design Edition and Manufacturing Edition in the design of our AMD Athlon 64 and AMD Athlon 64 FX processors and have been very pleased with the results", said Ed Gasiorowski, Director of Developer Relations, AMD Computation Products Group.
"To design extreme-performance AMD64 processors, AMD uses the power and flexibility of Cadence test tools to achieve our product test and manufacturing objectives".
Encounter Test Solutions expands on IBM's in-house electronic design automation (EDA) test tools and heritage, acquired in September 2002.
"We applaud Cadence's innovative efforts to assist customers as they face increasing complexity in both design and manufacturing", said Tom Reeves, vice president, ASIC Product Group, IBM Microelectronics.
"Cadence has built upon IBM's basic test technology with a focus on standardisation and commercial robustness to help further enhance test quality while reducing test time.
We continue to work closely with Cadence to combine that Cadence expertise with IBM technology to bring further benefits to customers".
"Cadence's commitment to the test sector is evident with the introduction of Encounter Test Solutions", said Penny Herscher, Cadence Executive Vice President and General Manager.
"We are offering customers the complete test package, which is unmatched by any competitor, but, more importantly, extends solutions into manufacturing, and helps save time and money in the process".
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