Product category: Design and Development Software
News Release from: Cadence Design Systems | Subject: Encounter Diagnostics
Edited by the Electronicstalk Editorial Team on 22 October 2004
Novel tool promises to boost nanometre
yields
Cadence Encounter Diagnostics is billed as the semiconductor industry's first yield diagnostics tool.
Cadence Encounter Diagnostics is billed as the semiconductor industry's first yield diagnostics tool Encounter Diagnostics accelerates yield by identifying customers' most critical nanometre IC yield issues and precisely locating root cause defects
This article was originally published on Electronicstalk on 20 Nov 2001 at 8.00am (UK)
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