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Product category: ATE Systems
News Release from: Agilent Technologies Europe | Subject: Cover-Extend Technology
Edited by the Electronicstalk Editorial Team on 21 March 2008
Test technology takes boundary scan a
step further
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Novel limited access technique for in-circuit testing eliminates the need for physical test points, offering benefits that traditional vectorless testing cannot provide.
Agilent Technologies has unveiled a limited access solution for in-circuit test (ICT) users that eliminates the need for physical test points, offering benefits that traditional VTEP test cannot provide Part of Agilent's VTEP v2.0 Powered test suite, the Agilent Cover-Extend Technology is a hybrid between two established test methodologies in the electronic manufacturing industry: boundary scan and VTEP vectorless test