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Product category: Electronics Manufacturing Materials and Consumables
News Release from: Agilent Technologies Europe | Subject: Medalist 5DX
Edited by the Electronicstalk Editorial Team on 04 January 2007

Software upgrades X-ray inspection
system

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Agilent Technologies has shipped its 8.4 software release with enhanced capabilities for the Medalist 5DX automated X-ray inspection (AXI) system.

Agilent Technologies has shipped its 8.4 software release with enhanced capabilities for the Medalist 5DX automated X-ray inspection (AXI) system End-users of the industry-leading 5DX can benefit from the following major AXI enhancements: A specialised new algorithm, allowing for inspection of quad-flat no-lead (QFN) with reduced false call rates; defect characterisation on nonwetted Direct FET (field-effect transistor) by using an open slope paste test, which was not possible previously; and a new threshold that enables end-users to inspect for solder presence along the side edges of a capacitor, in addition to the current capability for inspection at the ends of a capacitor