Click on the advert above to visit the company web site
Product category: ATE Systems
News Release from: Advantest (Europe) | Subject: T2000 LS Mainframe and M4841 Dynamic Test Handler
Edited by the Electronicstalk Editorial Team on 25 January 2008
Test cell wins industry recognition
Request your FREE weekly copy of the Electronicstalk email newsletter. News about ATE Systems and more every issue. Click here for details.
Advantest's SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.
Advantest's T2000 LS Mainframe and M4841 Dynamic Test Handler (the company's SoC test cell) have won a 2008 Best in Test Award Introduced at Semicon West 2007, Advantest's T2000 LSMF/M4841 test cell was selected by the editors of Test and Measurement World magazine, as a Best in Test product for its innovation and contribution to the field of electronics test, measurement and inspection