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Product category: ATE Systems
News Release from: Advantest (Europe) | Subject: T5587
Edited by the Electronicstalk Editorial Team on 18 August 2005
ATE speeds through multiple memory tests
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A new automatic tester for multichip package memory devices achieves high throughput by testing up to 512 devices in parallel.
With a best-in-class maximum parallel test capacity of 512 devices in its two-station configuration, the T5587 offers high throughput testing of MCP (multichip package) memory devices, which are in increasing demand for cellular telephones and other electronic gadgets The growing availability of wireless broadband services has fuelled the development of wireless handheld communications devices, including cellular telephones and PDAs, that woo consumers with an ever greater array of functions packed into ever smaller bodies