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Test Accessories
Archive page 15 of 16
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Test probes are easier and safer to use
Multi-Contact has upgraded its award-winning Isoprobe series of safety test probes for high-frequency engineering applications.
News from Multi-Contact (UK) (25 October 2002)
Novel lid tops off high-frequency test sockets
Aries Electronics now offers its line of high-frequency test sockets with a new cam lid that helps eliminate damage to package pads.
News from Aries Electronics (23 October 2002)
Improved scope for probe
Multi-Contact has introduced the next-generation design in its award-winning Isoprobe series of safety test probes for high-frequency engineering applications.
News from Multi-Contact (UK) (15 October 2002)
Fine-pitch for spring test probes
Peak Test Services has a new range of fine-pitch spring test probes for general-purpose testing on bare and loaded printed-circuit boards, surface-mount assemblies or individual components.
News from Peak Test Services (14 October 2002)
Probes add further functions to scope ranges
Gould Nicolet Technologies has a new range of Intelliprobes for its Ultima and Accura families of digital and transient storage oscilloscopes.