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Product category: Test Accessories
News Release from: Aries Electronics | Subject: High-frequency test sockets
Edited by the Electronicstalk Editorial Team on 23 October 2002
Novel lid tops off high-frequency test
sockets
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Aries Electronics now offers its line of high-frequency test sockets with a new cam lid that helps eliminate damage to package pads.
Aries Electronics now offers its line of high-frequency test sockets with a new cam lid that helps eliminate damage to package pads By providing precise z-directional force with no x or y movement, no stress is applied against the side of the contacts and solder balls remain undamaged