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Recruitment, Reports and Resources
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New criteria for measuring production defects
The Smart Group, supported by the Department of Trade and Industry, has launched an initiative for benchmarking parts per million (ppm) failures in electronics manufacturing.
News from Reed Exhibitions ( 1 May 2002)
New method to calculate assembly defect rates
The latest document from Dynamix Technology defines consistant methodologies for computation of in-process defects per million opportunities metrics for any evaluation stage in the assembly process.
News from Dynamix Technology (30 April 2002)
Free chipsets to aid interface design
To aid the development of CC-Link compatible devices and connectivity, the CC-Link Partner Association is offering free chipsets to all potential members who wish to design compatible interfaces. Brochure available
News from CC-Link Partner Association (29 April 2002)
Automated publishing speeds catalogue updates
Farnell has published its first catalogues using an advanced new automated publication management system (PMS).
News from Farnell InOne ( 9 April 2002)
Edge attracts strong market attention
The Global Mobile Suppliers Associatio