News Release from: Dynamix Technology
Edited by the Electronicstalk Editorial Team on 29 April 2002
New method to calculate assembly defect rates
The latest document from Dynamix Technology defines consistant methodologies for computation of in-process defects per million opportunities metrics for any evaluation stage in the assembly process.
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The latest document from Dynamix Technology defines consistant methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. IPC-9261 includes a guide to defect catergorisation that can serve as a base for summarising and reporting in-process defects when used with J-STD-001C and IPC-A-610C.
It can also be used to develop process step estimated yield - the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates.
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