Laurence Marchini, Editor, writes:
We see from your search that you're looking for information on the term "Pattern generator", and we have a large number of manufacturers' news releases and technical articles here on Electronicstalk which will be of interest. Let me be your guide.
Start with the news release Test helps improve optical efficiency from Anritsu (UK), which we summarised at the time by saying "Antitsu's stressed eye measurement suite provides optical modules and transmission equipment with an instrument that reduces measurement times and increases efficiency". A few weeks before, we featured the news release USB-based instrument does six jobs in one from Saelig Company: "Low-cost PC-based instrument combines scope, spectrum analyser, chart recorder, logic analyser, signal generator and pattern generator".
In October 2007, we covered the news from Spectrum Systementwicklung Microelectronic concerning its PCI Express bus AWGs - take a look at AWGs output any waveform which says: "Each card in the AWG family can run as a signal and test pattern generator or they can be used via an internal synchronisation option together with one of the digitiser cards of Spectrum".
Take a look also at the news release from Yokogawa Europe - Test and Measurement, Optical instrumentation extends to XFP modules, as well as Modules put optical transceivers to the test from Agilent Technologies Europe, and Wizard suits packaging suite from Zuken.
See also:
Digital pattern generators have flexible outputs (May 2007)
PC-compatible digital pattern generator boards feature up to 32Gbit memory, maximum clock rates of 40, 10 or 5MHz, and a choice of 16 or 32bit widths
Multiport enhancements for signal-integrity tester (May 2007)
PLTS version 4.0 simplifies multiple-aggressor differential crosstalk measurements in high-speed backplanes, allows easy importation of 12-port S-parameter data and pinpoints the location of problems
Star Hub boosts number of instruments for a test (May 2007)
The System Star Hub option for the UltraFast oscilloscope/digitiser, AWG and digital I/O and digital pattern generator PCI cards allows 270 cards to work in synch
64bit Vista expands scope of instrument cards (April 2007)
Windows Vista 64 and 32bit drivers are compatible with all 150 PCI, PXI and CompactPCI cards in the UltraFast series
PC instruments go online for UK distribution (March 2007)
Belgium-based Byte Paradigm has enlisted the help of Great Western Microsystems for product distribution and promotion in UK and Ireland
Diagnostics accelerate yield learning (March 2007)
UMC has adopted Synopsys TetraMAX diagnostics to accelerate yield learning for designs tha