News Release from: X-Tek Systems
Edited by the Electronicstalk Editorial Team on 17 January 2006
X-ray inspection system upgraded
X-Tek Systems will demonstrate the latest software and hardware advances to its Revolution X-ray inspection system at APEX this year.
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X-Tek Systems, one of the world's leading manufacturers of real-time microfocus X-ray systems, will be demonstrating the latest software and hardware advances to its Revolution X-ray inspection system at APEX this year (Booth 463). Getting its US premiere is the new Nanotech source offering improved defect detection thanks to feature recognition in the nanometre range. The Revolution offers a greater degree of inspection than any comparable system with a viewing angle of up to 75 degrees, just 15 degrees to the plane of the board.
This combination allows for maximum magnification (up to 6000x) at all angles over the entire 410 x 410mm manipulator scan area, for 100% BGA, micro-BGA, multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations.
X-Tek's unique 160XI cable-free open X-ray tube offers true Nanotech resolution in an extremely stable and low-maintenance format, with quick-change extended life filaments.
The system also features a new PCB programming interface for the user-friendly InspectX software, designed to streamline programming requirements, as well as automatic BGA software.
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Copyright © 2000-2006 Pro-Talk Ltd, UK. Based on news supplied by X-Tek Systems - Subject: Revolution