KETI is keen on X-ray inspection: News from X-Tek Systems

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KETI, the Korean Electric Testing Institute, has taken delivery of one of the first export orders for X-Tek Systems' top of the range Orbita real-time microfocus X-ray inspection systems. The advanced new Orbita has been purpose-designed for inspecting large PCBs and electronic assemblies and is the first X-ray system to integrate, 75-degree oblique view imaging, true concentric imaging and true parallel tracking. Commenting on the organisation's choice of the Orbita, Duk-Hyun Choi, Team Leader at KETI's said, "KETI is a centralised testing house for the large number of small to medium sized electronics and technology manufacturers in Korea.

With the X-Tek Orbita system we are able to offer Korean companies the benefit of using one of the most advanced real-time microfocus X-ray inspection systems available today".

Paul Ramsay, X-Tek Systems' Sales and Marketing Manager added: "KETI sets the highest standards for product testing and quality assessment in Korea, so we are delighted that they have chosen the X-Tek Orbita.

As a leader in the truly global market for X-ray inspection in the electronics industry, with a growing presence in the Asia-Pacific region, we feel there is no higher recommendation than KETI's purchase of X-Tek".

Designed for manual and programmed inspection of large area PCBs and electronic components, the Orbita sets new standards in performance and ergonomics and comes complete with an adjustable tri-shelf control platform and auto-load positioning manipulator.

The Orbita also makes it easier for operators to produce scan results previously unattainable from X-ray systems.

Ideal for inspecting BGA ball wetting, ball to pad delaminations, cracked BGA joints and lifted bond wires, the revolutionary new Orbita achieves oblique angles of up to 75 degrees by coupling the X-ray source and imaging intensifier on a single axis.

Replacing a traditional tilt axis in this way ensures that the image remains in the centre of the region of interest at all angles of tilt.

For quick and effective scanning of single or multiple BGA balls, the Orbita's true concentric imaging operates over the entire scan area of the manipulator with the region of interest remaining locked regardless of a sample's position on the manipulator.

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News Release from: X-Tek Systems Edited by the Electronicstalk Editorial Team on 29 January 2003

KETI is keen on X-ray inspection

KETI, the Korean Electric Testing Institute, has taken delivery of one of the first export orders for X-Tek Systems' top of the range Orbita real-time microfocus X-ray inspection systems.

Note: Readers of the Editor’s free email newsletter will have read this news when it was announced. . It’s free!

News Release from: X-Tek Systems
Edited by the Electronicstalk Editorial Team on 29 January 2003