Product category: Stand-Alone Instruments
News Release from: X-Tek Systems | Subject: Orbita
Edited by the Electronicstalk Editorial Team on 7 October 2002
Low-cost real-time X-ray
inspection at Nepcon
X-Tek Systems staged the UK launch of its advanced new Orbita X-ray system at Nepcon
Purpose-designed for inspecting large PCBs, the Orbita is the first X-ray system to integrate 75-degree oblique view imaging, true concentric imaging and true parallel tracking. Designed for manual and programmed inspection of large area PCB's and electronic components, the Orbita sets new standards in performance and ergonomics and comes complete with an adjustable tri-shelf control platform and auto-load positioning manipulator.
Related stories
A new angle on X-ray PCB inspection
Purpose-designed for PCB inspection, the Orbita is said to be the first microfocus X-ray system capable of providing an indexing 75-degree oblique view while maintaining true geometric magnification
Inspection system for computerised tomography
The X-Tek Group will announce a new camera and detector combination for the Revolution NanoTech X-ray inspection system at APEX 2007
The Orbita makes it easier for operators to produce scan results previously unattainable from X-ray systems.
Ideal for inspecting BGA ball wetting, ball to pad delaminations, cracked BGA joints and lifted bond wires, the revolutionary new Orbita achieves oblique angles of up to 75 degrees by coupling the X-ray source and imaging intensifier on a single axis.
Replacing a traditional tilt axis in this way ensures that the image remains in the centre of the region of interest at all angles of tilt.
Further reading
Computerised tomography aids joint inspection
The X-Tek Group has added computerised tomography (CT), a powerful new 3D imaging capability, to its advanced Revolution microfocus system
For quick and effective scanning of single or multiple BGA balls, the Orbita's true concentric imaging operates over the entire scan area of the manipulator with the region of interest remaining locked regardless of a sample's position on the manipulator.
Traditional machines require the highly skilled tilt and rotate operations of the manipulator in three axes to give an unobstructed view of BGA balls.
The unique true parallel tracking feature on the Orbita maintains the x and y axes parallel to the BGA so that rows can be more easily scanned using just a single x- or y-axis.
This parallel tracking feature is a unique to the Orbita's manipulator design and is fully independent of any control algorithms.
A single fully programmable PC running X-Tek's own IXS integrated system software is used to control the X-ray source, the manipulator and image processing of the Orbita.
X-Tek's latest control software protects even the most fragile samples by eliminating any potential for collision between sample, manipulator, imaging and X-ray source.
The Orbita incorporates X-Tek's unique and fully integrated XI X-ray source coupled with the latest 2-micron target.
It uses an ultrathin beryllium window to provide a brighter image with enhanced resolution and geometric magnification up to 2400x.
As with every other X-Tek product, the X-ray source, the X-ray controller and lead-lined cabinet for the new Orbita model are all designed and manufactured at X-Tek's headquarters in the UK to assure the highest quality standards.
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