Product category: Design and Development Software
News Release from: XJTAG | Subject: XJTAG 2.0
Edited by the Electronicstalk Editorial Team on 31 October 2007
Development system tracks designs for
testability
XJTAG 2.0 has a raft of new features, including automated JTAG chain discovery and setup, a built-in netlist explorer, optimised memory test and real-time design for test coverage tracking.
XJTAG has brought out version 2.0 of its popular boundary scan development system, which is reckoned to set a new standard for speed and accuracy of printed circuit board (PCB) debug and test The new version of the XJTAG system - which is used throughout the electronic product life cycle by board developers and manufacturers to debug, test and program complex ball grid array (BGA) populated printed circuit boards and systems - will be unveiled by XJTAG at Productronica (Area A1/Booth 448)
This article was originally published on Electronicstalk on 20 Dec 2005 at 8.00am (UK)
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XJTAG 2.0 has a raft of new features, including automated JTAG chain discovery and setup, a built-in netlist explorer, optimised memory test and real-time design for test (DFT) coverage tracking.
It also includes an ever growing library of device-centric test scripts, improved integration with LabView, and support for X