Product category: Test Accessories
News Release from: Antares Advanced Test Technologies
Edited by the Electronicstalk Editorial Team on 11 April 2007
Strauss joins test industry leaders
Steven B Strauss was one of four 'industry leaders' invited to speak at the eighth annual BiTS Workshop held last month in Mesa, Arizona
Steven B Strauss, Vice President of Engineering for Antares Advanced Test Technologies was one of four 'industry leaders' invited to speak at the eighth annual BiTS Workshop held last month in Mesa, Arizona. The BiTS conference brings together semiconductor test professionals from more than 100 companies around the world to discuss the latest trends in the burn-in and test socket market.
This article was originally published on Electronicstalk on 11 April 2007 at 8.00am (UK)
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Members of Antares' engineering team joined Strauss at BiTS and presented four research papers to an audience of their peers.
'We certainly think our presence at BiTS affirms that our engineering team is among the most knowledgeable and forward-thinking in the test industry', said Matt Bergeron, CEO of Antares Advanced Test Technologies.
'And, of course, we never miss a chance to talk test with some of our industry's best minds'.
Strauss gave his speech on the night during the opening dinner.
Other presentations were: 'Elastomeric interconnects - reliable enough for production test?' by Frank Bumb, Jack Pereschuk of Phoenix Test Arrays with Nick Langston Sr of Antares Advanced Test Technologies; 'Socket signal integrity - impact from IC and board' by James Zhou, Jiachun (Frank) Zhou of Antares Advanced Test Technologies; 'Minimising socket and board inductance using a novel decoupling interposer' by Nicholas Langston Sr, James Zhou, Hongjun Yao of Antares Advanced Test Technologies; and 'The importance of the mechanical interface in final test efficiency' by Mark Stenholm of Antares Advanced Test Technologies.
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