Product category: Intellectual Property Cores
News Release from: Virage Logic | Subject: STAR Memory System
Edited by the Electronicstalk Editorial Team on 11 January 2005
Embedded memory system addresses
nanometre issues
A leading provider of semiconductor IP platforms and pioneer in self-test and self-repair embedded memories, Virage Logic Corp.
Virage Logic Corp continues to break new ground with the announcement of its third-generation Self-Test and Repair (STAR) Memory System The third-generation STAR Memory System remains the only commercially available integrated embedded memory self-test and self-repair solution
This article was originally published on Electronicstalk on 4 Mar 2003 at 8.00am (UK)
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As such, it provides cost-effective on-chip testing and repairing of designs embedding megabits of memories, but adds significant enhancements that result in faster time-to-market, lower test costs, smaller area and better yield for complex system-on-chip (SoC) designs.
The enhancements provide increased intelligence a