Product category: Stand-Alone Instruments
News Release from: Tektronix | Subject: RFID measurement and analysis suite
Edited by the Electronicstalk Editorial Team on 10 October 2005
Real-time spectrum analysers
extend to RFID
Tektronix has introduced a new RFID software measurement suite for its WCA200A, RSA3300A and RSA3408A real-time spectrum analysers
Already the most capable spectrum analyser for RFID testing, Tektronix continues to advance the capabilities of real-time spectrum analysers by adding new measurements and troubleshooting features specifically designed to help the RFID engineer. Wireless technologies continue to proliferate across industries such as healthcare, government, supply chain management, transportation and retail.
This article was originally published on Electronicstalk on 10 October 2005 at 8.00am (UK)
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In all of these markets, RFID is becoming prevalent.
Like all modern digital RF, RFID is becoming increasingly sophisticated and complex, employing time-varying RF signals, such as frequency-hopping spread spectrum and transmission timing controls.
This trend requires more sophisticated test equipment and intelligent software applications to help engineers visualise the correlation between the time, frequency, modulation, and data domains.
The new Tektronix RFID measurement and analysis suite for real-time spectrum analysers will provide customers with higher confidence in the quality of the product they deliver.
'With the explosion of RFID technologies, designers are asking for greater capabilities from test and measurement instruments that are beyond the functionality of traditional spectrum analysers', said Rick King, Vice President, Real-Time Spectrum Analyser Product Line, Tektronix.
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'With the RFID measurement suite for real-time spectrum analysers, engineers can quickly troubleshoot new RFID designs, accurately verify the performance of the designs, and ensure adherence to relevant RFID industry standards'.
'This will foster the rapid development of quality products, and reduce time to market'.
'We have used Tektronix real-time spectrum analysers in our testing as part of RFID device development', said David Sherry, Project Manager and Senior Consultant for the Location and Tracking Group, Roke Manor Research.
'The RSA3408A has helped us greatly to find and characterise transient RFID signals'.
'This has improved our design and development productivity and ultimately our time to project completion'.
RFID continues to gain traction as a core technology of the wireless world.
Increasingly, designs are moving from the requirement of the RFID tag actually touching the reader to one where this physical connection with a reader is not necessary.
Examples of such applications include RFID tags for toll collection, secure building access, and controls for subassembly movement.
These environments are often characterised by the presence of multiple interrogators and tags that reside in the same area.
This introduces interference as a major design constraint.
In turn, the issue of interference when deploying multiple RFID systems drives needs for anticollision techniques such as listen before talk (LBT), frequency hopping and strict management of duty-cycle of signal.
Increasing the datarate drives the need for high performance time related measurements such as power up/down rise/fall and turnaround time.
To assist engineers with this challenge, the new RFID measurement suite for Tektronix real-time spectrum analysers provides support for RFID standard ISO18000 part 4 (mode 1) and part 6 (Type A, B and C) as well as the Electronic Product Code Generation 2 (EPC Gen2).
Offered as options for the WCA200A, RSA3300A and RSA3408A real-time spectrum analysers, the suite will help designers develop proper RF and modulation techniques that provide excellent response in both the frequency and time domain in accordance with specifications defined in the respective standards.
With these additions, Tektronix real-time spectrum analysers extend their industry-leading capabilities for RFID, enabling engineers to quickly solve transient RF design problems.
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