Product category: Stand-Alone Instruments
News Release from: Tektronix | Subject: DTG5334
Edited by the Electronicstalk Editorial Team on 11 February 2005
Data timing generator is
source of logical test
The Tektronix DTG5334 data timing generator and three new output modules expand the company's DTG5000 logic source family
The new DTG5334 provides a fast 3.35Gbit/s datarate, while the output modules deliver increased performance and flexibility for serial data as well as parallel data applications. The DTG5334 is designed to help engineers satisfy compliance and functional test needs for many high-speed serial data standards such as SATA2, PCI Express, and HDMI.
This article was originally published on Electronicstalk on 11 February 2005 at 8.00am (UK)
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Today's design engineers are faced with the challenge of performing functional, validation and compliance tests on circuits and system elements at increasing datarates.
High-speed serial data standards require data timing generators with low output jitter and the ability to inject specified levels of intentional jitter as part of the testing process.
Tektronix' DTG5334 and DTGM31 output module are an ideal solution for serial data generation at datarates up to 3.35Gbit/s with jitter modulation up to 250MHz.
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'Signal sources such as the new DTG5334 are a key part of our corporate 4+2 strategy whereby Tektronix establishes leading positions in six identified markets', said Craig Overhage, Vice President, Instrument Business Unit, Tektronix.
'Tektronix is firmly committed to the signal source market which is one of our +2 product categories'.
'With the DTG5334, engineers will have a more powerful digital timing generator to aid designing, debugging and testing their device resulting in shorter overall project schedule and reduced time to market'.
The DTG5334 data timing generator operates at datarates from 50Kbit/s to 3.35Gbit/s, with up to eight output channels per mainframe and includes 64Mbit of pattern memory per channel.
Up to 16 output channels can be supported though master/slave synchronisation of two DTG5334 mainframes.
The new DTM21 output module enables tests on a wide range of native logic families by providing higher amplitude output (up to 5.35V into 50ohm) and includes tri-state output control for bidirectional bus and memory device testing.
The DTGM31 output module meets serial data validation and compliance stress testing needs with a jitter modulation input for frequencies up to 250MHz and amplitudes up to 240ps.
External jitter control allows the emulation of real-world signals, enabling early testing and validation.
And the new DTGM32 provides two jitter modulation inputs specifically to meet the needs of standards such as HDMI with jitter frequencies up to 50MHz and amplitudes up to 2ns.
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