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Product category: Stand-Alone Instruments
News Release from: Tektronix | Subject: TDSJIT3 jitter analysis software
Edited by the Electronicstalk Editorial Team on 3 July 2002

Software puts scopes in
line for jitter analysis

Tektronix has unveiled a jitter analysis software package for its open Windows oscilloscopes it claims enables the highest accuracy real-time jitter measurements available in the industry

With tighter timing margins and faster clock rates associated with today's high-speed designs, jitter is more commonly a significant cause of system error. To address this challenge, jitter component identification and measurement is a necessary debug tool, and is even required in several serial data communication standards, such as Fibre Channel, Sonet, SDH, and Gigabit Ethernet.

Tektronix' TDSJIT3 is the most advanced jitter analysis software package available.

Its comprehensive jitter analysis algorithms simplify discovering jitter and its related sources so that engineers can rapidly deliver more robust designs to market.

"With decades of leadership in signal fidelity and analysis, Tektronix has continuously driven the industry forward and set benchmarks for others to follow.

By combining the fastest real-time oscilloscope in the world with this application-focused software, Tektronix gives customers the solution they need to accelerate the design process", said Colin Shepard, Vice President, Oscilloscope Products, Tektronix.

Adds Shepard, "We were the first to offer internal measurements, complex triggers, internal applications, and an open Windows platform in oscilloscopes.

Now, TDSJIT3 is the first real-time solution capable of characterising random and deterministic jitter (Rj/Dj) and predicting bit error ratio (BER).

Using these features, engineers can quickly and easily predict system BER, a good indicator of overall system quality, in mere seconds, versus the minutes or hours required by other tools".

The TDSJIT3 jitter analysis software extends oscilloscope capability by making jitter measurements over contiguous clock cycles from every valid pulse in a single shot acquisition.

Measurements can be made on single-ended or differential inputs, multiple channels and channel-to-channel inputs.

Multiple measurements or plots can be displayed and trend plots quickly show how various timing parameters change over time, like frequency drift or a clock's response to power supply changes.

Comprehensive statistics for each selected measurement and histograms of timing parameters enhance the software's powerful analysis capabilities.

Users can make a setup-time measurement for a specific data edge to the exact corresponding clock edge for all valid transitions in an entire acquisition.

Finally, users can characterise random and deterministic jitter (Rj/Dj) and predict system bit error ratio with a general-purpose tool, the oscilloscope.

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