Product category: Stand-Alone Instruments
News Release from: Tektronix | Subject: TDS6604
Edited by the Electronicstalk Editorial Team on 31 January 2002
World's fastest scope
boasts 6GHz bandwidth
Tektronix reckons its latest oscilloscope provides engineers designing high-speed digital systems with advanced debug and analysis capabilities that are unmatched on today's market
At 6GHz, the TDS6604 is the world's fastest digital storage oscilloscope (DSO), and is Tektronix' second-generation high-performance silicon-germanium (SiGe) instrument. With this introduction, Tektronix is poised to enable the transition from wide parallel bus architecture to narrow, point-to-point, serial bus architecture with gigabit datarates.
This article was originally published on Electronicstalk on 31 January 2002 at 8.00am (UK)
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Implementing serial bus architecture made popular for more than two decades in the telecommunications industry, computer and data communication design engineers are increasingly challenged by faster signals, tighter timing tolerances and other signal integrity problems that arise from the analogue behaviour of digital signals.
Featuring an unparalleled sample rate of 20Gsample/s on two channels simultaneously, Tektronix' new four-channel oscilloscope offers the latest evolution in enabling digital design engineers to rapidly and effectively pinpoint faults in emerging high-speed serial bus architectures such as InfiniBand, RapidIO, 3GIO,and HyperTransport.
"The TDS6604 - the worlds fastest oscilloscope, enables our customers to address their most demanding digital design challenges", said Colin Shepard, vice president, Oscilloscope Product Line, Tektronix.
"Its 6GHz bandwidth eclipses the benchmark set over a year ago by the TDS7404, clearly affirming Tektronix' position as the market leader in high-performance oscilloscopes".
With its ability to support single shot acquisition at 6 GHz, the TDS6604 is the first oscilloscope with multiple-channel acquisition at such speeds.
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This exceptional performance is key to high-speed signal integrity measurement work; it enables accurate capture of the brief transients and fast signal edges that affect digital system performance.
The TDS6604 includes Tektronix' pioneered triggering features, which support clock recovery at datarates up to 2.5Gbit/s and serial pattern trigger (option ST) at up to 1.25Gbaud.
It is also the first DSO to incorporate the proven Open Windows platform, providing easy access to industry-standard peripherals, networking elements, and analysis tools.
The TDS6604 supports Tektronix' broad selection of automated measurement packages such as TDSJIT2 for jitter measurements, TDSUSB2 for USB 2.0 compliance testing, and more.
Mask testing capabilities are available through option SM, which provides a portfolio of masks, allowing users to select from among electrical standards, such as SDH/SONET, Fibre Channel, Ethernet, InfiniBand, USB, Serial ATA and IEEE 1394, to perform compliance testing.
This breakthrough instrument addresses an issue of growing concern among developers: digital errors caused by underlying analogue signal integrity problems.
As digital system clock rates and bus speeds escalate, there is ever decreasing tolerance for analogue signal problems and digital designers need to quickly identify and analyse these phenomena.
When coupled with a Tektronix TLA Series logic analyser via Tektronix' Integrated View (iViewT) package for viewing both digital and analogue time-correlated waveforms on a single display, the TDS6604 helps designers rapidly and effectively develop cutting-edge computer and communications products.
(This was Electronicstalk's Top Story on 31 January 2002)
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