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Product category: Design and Development Software
News Release from: Synopsys | Subject: Device-parameter measurement in Hercules PVS
Edited by the Electronicstalk Editorial Team on 16 March 2007
Device paramater measurement added to
Hercules PVS
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Advanced device-parameter measurement added to the Hercules Physical Verification Suite (PVS) to correlate device behaviour to IBM 65nm semiconductor process.
Synopsys has announced the availability of advanced device-parameter measurement capability in its Hercules Physical Verification Suite (PVS) Developed to support the latest release of 65nm design kits from IBM, this new capability enables IBM foundry customers using the Hercules layout versus schematic (LVS) rule files in the kit to easily and accurately correlate device behaviour to the IBM process