Product category: Design and Development Software
News Release from: Silicon Metrics | Subject: SiliconSmart SI
Edited by the Electronicstalk Editorial Team on 07 March 2003
Signal integrity modelling spots fatal
flaws
New from Silicon Metrics, SiliconSmart SI provides cell characterisation and modelling of signal integrity (SI), a critical requirement for complex SoC designs at 130nm and below.
New from Silicon Metrics, SiliconSmart SI provides cell characterisation and modelling of signal integrity (SI), a critical requirement for complex SoC designs at 130nm and below The tool, based on Silicon Metrics' industry-leading characterisation technology, is the first of its kind to fully support the noise models of the popular Liberty format
This article was originally published on Electronicstalk on 18 Oct 2001 at 8.00am (UK)
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