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Product category: Stand-Alone Instruments
News Release from: Olympus Life Science Europa | Subject: MX61
Edited by the Electronicstalk Editorial Team on 27 June 2005
Microscope spots more wafer errors
The new Olympus MX61 semiconductor inspection microscope for 200/300mm wafers, improves process inspection by increasing the failure detection rate.
The new Olympus MX61 semiconductor inspection microscope for 200/300mm wafers, improves process inspection by increasing the failure detection rate Automatic optimisation of contrast coupled with an intuitive and easy to use interface, minimises errors and reduces the variation of results between operators
This article was originally published on Electronicstalk on 11 Oct 2006 at 8.00am (UK)