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Product category: Stand-Alone Instruments
News Release from: Olympus Life Science Europa | Subject: BX51
Edited by the Electronicstalk Editorial Team on 22 November 2001
Infra-red scope checks semiconductor
materials
A new system for infra-red observation has been developed by Olympus for use with the BX51 metallurgical microscope.
A new system for infra-red observation has been developed by Olympus for use with the BX51 metallurgical microscope Near-infra-red light observations are a valuable method of studying semiconductor interiors and the back surface of a chip package, as well as CSP bump inspections